Automated metric-based assessment requires a metric design environment to explore algorithms that will isolate defect signatures and quantify them with well-behaved metrics. Shield simplifies this process to three steps where signals are reduced to features, features are reduced to metrics and metrics are used to build robust Pass/Fail limit tests.
Complex dynamic signals are presented in a 3D time/frequency display where you can interactively explore signal details such as harmonics, resonance, and impulse behaviors.
Use standard NVH analysis methods to build 2D waveforms such as order cuts, spectra, impulse indicators and other time or angle domain analysis features.
Extract the signal processing definition of important waveforms to the Feature Extraction List so they can be further processed into single-number metrics on the Feature Extraction Tab.
Metrics extracted from features are available on the decision tab to define Pass/Fail criteria against individual metrics.